JPH0368083U - - Google Patents

Info

Publication number
JPH0368083U
JPH0368083U JP12895989U JP12895989U JPH0368083U JP H0368083 U JPH0368083 U JP H0368083U JP 12895989 U JP12895989 U JP 12895989U JP 12895989 U JP12895989 U JP 12895989U JP H0368083 U JPH0368083 U JP H0368083U
Authority
JP
Japan
Prior art keywords
circuit board
probe pin
pin
probe
parallel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12895989U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0755508Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12895989U priority Critical patent/JPH0755508Y2/ja
Publication of JPH0368083U publication Critical patent/JPH0368083U/ja
Application granted granted Critical
Publication of JPH0755508Y2 publication Critical patent/JPH0755508Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
JP12895989U 1989-11-02 1989-11-02 回路基板検査装置 Expired - Lifetime JPH0755508Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12895989U JPH0755508Y2 (ja) 1989-11-02 1989-11-02 回路基板検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12895989U JPH0755508Y2 (ja) 1989-11-02 1989-11-02 回路基板検査装置

Publications (2)

Publication Number Publication Date
JPH0368083U true JPH0368083U (en]) 1991-07-03
JPH0755508Y2 JPH0755508Y2 (ja) 1995-12-20

Family

ID=31676629

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12895989U Expired - Lifetime JPH0755508Y2 (ja) 1989-11-02 1989-11-02 回路基板検査装置

Country Status (1)

Country Link
JP (1) JPH0755508Y2 (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108051730A (zh) * 2017-12-28 2018-05-18 重庆市中光电显示技术有限公司 电路板检测用导通治具

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108051730A (zh) * 2017-12-28 2018-05-18 重庆市中光电显示技术有限公司 电路板检测用导通治具

Also Published As

Publication number Publication date
JPH0755508Y2 (ja) 1995-12-20

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term